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Plarion’s advanced microscopy suite includes the following tools;
AFM (atomic force microscopy) 
- With conductive and tapping modes for nanometre resolution surface profiling.
White light ellipsometry
- For measuring the optical properties of multi-layered films, eg refractive index & thickness
- SEM (scanning electron microscope) with EDX (Energy Dispersive X ray) analysis
- For materials evaluation and failure analysis, for example of fine fractures..
Optical microscopy
- With standard brightfield mode, darkfield mode for examining biological samples and subtle surface defects, and oil immersion mode for increased resolution.
Defect scanning
- Surface inspection for detection of material irregularities and defects.
Dektak profilometry
- For millimetre scale surface profiling with nanometre scale accuracy.
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