Materials Analysis

Plarion has the following advanced analysis tools for investigating optical properties (reflectance, refractive index), roughness, structure, composition, thermal properties and much more.

Ellipsometry

For measuring the optical properties of multi-layered films, eg refractive index & thickness.

SEM (scanning electron microscope) with EDX (Energy Dispersive X ray) analysis

For determining atomic composition and elemental mapping.

FTIR (Fourier Transform Infra Red) analysis

For quantitative determination of molecular compositions allowing liquid analysis, thin film characterisation and investigation of polymer degradation.

UV-Vis spectroscopy

For characterisation and identification of materials, and thickness and concentration control of liquids and solids.

Thermal conductivity measurement

For determining the thermal conductivity of thin films, which differs markedly from its bulk characteristic.